发明授权
- 专利标题： Electrical contact probe
- 专利标题（中）： 电接触探头
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申请号： US13083申请日： 1998-01-26
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公开(公告)号： US6020747A公开(公告)日： 2000-02-01
- 发明人: John T. Bahns , Eli K. Dabora
- 申请人： John T. Bahns , Eli K. Dabora
- 专利权人： Bahns; John T.,Dabora; Eli K.
- 当前专利权人： Bahns; John T.,Dabora; Eli K.
- 主分类号： G01R1/067
- IPC分类号： G01R1/067
摘要：
The present invention is directed to an electrical contact probe, comprising at least one fiber mounted in a holder, the at least one fiber having high electrical conductivity and high mechanical strength and made from a material selected from the group consisting of a conductive organic material and a conductive glass, the at least one fiber having a diameter in the range from 5 nanometers to 20 micrometers. The present invention is also directed to a device to measure various electrical parameters of a circuit.
公开/授权文献
- USD357499S Offset printing machine 公开/授权日：1995-04-18