发明授权
US6032270A Data processor testing apparatus and a data processor testing method
失效
数据处理器测试仪器和数据处理器测试方法
- 专利标题: Data processor testing apparatus and a data processor testing method
- 专利标题(中): 数据处理器测试仪器和数据处理器测试方法
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申请号: US27718申请日: 1998-02-23
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公开(公告)号: US6032270A公开(公告)日: 2000-02-29
- 发明人: Takeshi Furukawa , Shinichi Nakamura
- 申请人: Takeshi Furukawa , Shinichi Nakamura
- 申请人地址: JPX Kawasaki
- 专利权人: Fujitsu Limited
- 当前专利权人: Fujitsu Limited
- 当前专利权人地址: JPX Kawasaki
- 优先权: JPX9-201907 19970728
- 主分类号: G06F12/16
- IPC分类号: G06F12/16 ; G06F11/22 ; G06F11/36 ; G06F12/08 ; G06F11/00
摘要:
A data processor testing apparatus, in which, in an access instruction executing section, an instruction string to be tested for access to cache memories as an object for execution is previously prepared, access data on a memory is set in an instruction cache memory and operand cache memory according to the instruction string to be tested, and in a BI control section, the access data set as described above is invalidated with the BI signal when the access data set in the operand cache memory is data for an address previously decided as an object for invalidation on the memory, and determination is made by a comparison control section as to whether a result of invalidation is acceptable or not.
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