A sample analyzer includes a light source for emitting light for analyzing a sample and a probe having at its one end a light outlet aperture which is smaller in diameter than the wavelength of the light emitted from the light source. An incident optical system causes the light emitted from the light source to enter the probe through the other end of the probe. A sample support supports the sample in a position where the sample is exposed to near field light emitted from the light outlet aperture of the probe. A diffusion panel receives scattered light generated by interaction between the surface of the sample and the near field light and visualizes the intensity distribution pattern of the scattered light. A CCD image taking device takes an image of the intensity distribution pattern of the scattered light visualized by the diffusion panel, and the image of the intensity distribution pattern of the scattered light taken by the image taking device is displayed on a CRT.