发明授权
- 专利标题: Method for improving fault coverage of an electric circuit
- 专利标题(中): 改善电路故障覆盖的方法
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申请号: US821141申请日: 1997-03-20
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公开(公告)号: US6059451A公开(公告)日: 2000-05-09
- 发明人: Kyl W. Scott , James M. Skidmore
- 申请人: Kyl W. Scott , James M. Skidmore
- 申请人地址: TX Dallas
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: TX Dallas
- 主分类号: G01R31/3183
- IPC分类号: G01R31/3183 ; G01R31/38
摘要:
The present invention is a method and system which determine signal probability and transfer probability for each node in a netlist describing an electrical circuit; determine, using the signal probability and transfer probability, a fault detection probability for each node; and, using the fault detection probabilities, determine overall fault coverage of the electrical circuit described in the netlist. The method and system of the present invention then, using the fault coverage data, heuristically determine a set of testpoints to be inserted into the netlist which increase the overall fault coverage of the electrical circuit above a predetermined value.
公开/授权文献
- US4203241A Action sign 公开/授权日:1980-05-20
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