发明授权
- 专利标题: Strained Si/SiGe layers on insulator
- 专利标题(中): 绝缘体上的应变Si / SiGe层
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申请号: US311468申请日: 1999-05-13
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公开(公告)号: US6059895A公开(公告)日: 2000-05-09
- 发明人: Jack Oon Chu , Khalid EzzEldin Ismail
- 申请人: Jack Oon Chu , Khalid EzzEldin Ismail
- 申请人地址: NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: NY Armonk
- 主分类号: H01L21/02
- IPC分类号: H01L21/02 ; H01L21/20 ; H01L21/762 ; H01L27/12 ; H01L29/00
摘要:
An SOI substrate and method for forming is described incorporating the steps of forming strained layers of Si and/or SiGe on a first substrate, forming a layer of Si and/or S.sub.i O.sub.2 over the strained layers, bonding a second substrate having an insulating layer on its upper surface to the top surface above the strained layers, and removing the first substrate. The invention overcomes the problem of forming strained Si and SiGe layers on insulating substrates.
公开/授权文献
- US5507657A Electrical connector cover 公开/授权日:1996-04-16
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