发明授权
- 专利标题: Method of preparing semiconductor surface
- 专利标题(中): 制备半导体表面的方法
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申请号: US4612申请日: 1998-01-08
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公开(公告)号: US6066571A公开(公告)日: 2000-05-23
- 发明人: Koji Usuda , Keisaku Yamada
- 申请人: Koji Usuda , Keisaku Yamada
- 申请人地址: JPX Kawasaki
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JPX Kawasaki
- 优先权: JPX9-013235 19970110
- 主分类号: H01L21/306
- IPC分类号: H01L21/306 ; H01L21/302
摘要:
A method of preparing a semiconductor work surface comprises the steps of forming an Si monocrystaline substrate including a semiconductor work surface, removing by wet-etching a silicon oxide film formed on the work surface, using HF solution, and washing the work surface by pure water, serving as a washing liquid, of a dissolved oxygen concentration of 500 ppb or lower. The work surface is made of monocrystal and has an orientation a certain amount off the (001) plane. The certain amount is set such that an axis of the work surface has a component inclined with an angle of from 1.degree. to 5.degree. from the [001] direction to a direction. The washing liquid of pure water has a property of etching the Si monocrystal, such that a single or a plurality of surfaces, including the (111) plane, can be preferentially exposed.
公开/授权文献
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