发明授权
- 专利标题: Probe scanning apparatus
- 专利标题(中): 探头扫描仪
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申请号: US855543申请日: 1997-05-13
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公开(公告)号: US6078044A公开(公告)日: 2000-06-20
- 发明人: Masatoshi Yasutake , Yukihiro Sato
- 申请人: Masatoshi Yasutake , Yukihiro Sato
- 申请人地址: JPX
- 专利权人: Seiko Instruments Inc.
- 当前专利权人: Seiko Instruments Inc.
- 当前专利权人地址: JPX
- 主分类号: F16F9/30
- IPC分类号: F16F9/30 ; F16F9/52 ; G01B7/34 ; G01N27/00 ; G01Q10/02 ; G01Q10/04 ; G01Q70/02 ; H01J37/00
摘要:
A probe scanning apparatus for use in a device for measuring the shape of a surface or the physical properties of a sample comprises a probe and voice coil motors for generating a moving force for moving the probe in each of three directions x, y and z upon activation of the voice coil motors. A probe supporting mechanism is mounted for movement in the three directions x, y and z by the moving forces generated by the voice coil motors upon activation thereof to effect coarse/fine movement of the probe in the direction z and to scan the probe in the directions x and y.
公开/授权文献
- US4191132A Thermic reactor 公开/授权日:1980-03-04
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