发明授权
- 专利标题: Dynamic configuration of a device under test
- 专利标题(中): 被测设备的动态配置
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申请号: US161108申请日: 1998-09-25
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公开(公告)号: US6081864A公开(公告)日: 2000-06-27
- 发明人: Mike Lowe , Paul Berndt , Tahsin Askar , Enrique Rendon
- 申请人: Mike Lowe , Paul Berndt , Tahsin Askar , Enrique Rendon
- 申请人地址: CA Sunnyvale
- 专利权人: Advanced Micro Devices, Inc.
- 当前专利权人: Advanced Micro Devices, Inc.
- 当前专利权人地址: CA Sunnyvale
- 主分类号: G06F11/267
- IPC分类号: G06F11/267 ; G06F13/40 ; G06F17/50 ; G06F13/00
摘要:
A system and method for dynamic verification of functionality of an HDL (Hardware Description Language) design of a computer system component is disclosed. A simulated model of the HDL design is created. A test configuration for the simulated model is selected through a configuration interpretation mechanism, based on a plurality of user-supplied parameters. The user-supplied parameters, for example, include the amount of the memory in the system, the number of memory banks, addresses of various PCI devices, the type of the CPU etc. The test configuration is then compiled. At run-time, the test configuration is simulated. The responses by the simulated model of the HDL design to various test stimuli from a stimulus file are then evaluated under the chosen test configuration. One or more different test configurations may be simulated at run-time, and the stimulated model's responses to a pre-determined set of test stimuli may be reevaluated for each such test configuration. Thus, the test configuration is effectively separated from the test stimulus generation mechanism. This allows permutations of a given test suite across many test configurations without creating extremely large number of tests.
公开/授权文献
- US5436615A Overflow detection system 公开/授权日:1995-07-25
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