发明授权
- 专利标题: Overlay measurement improvement between damascene metal interconnections
- 专利标题(中): 镶嵌金属互连之间的叠加测量改进
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申请号: US228124申请日: 1999-01-11
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公开(公告)号: US6093640A公开(公告)日: 2000-07-25
- 发明人: Jung-Hsien Hsu , Jenn-Ming Huang
- 申请人: Jung-Hsien Hsu , Jenn-Ming Huang
- 申请人地址: TWX Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company
- 当前专利权人: Taiwan Semiconductor Manufacturing Company
- 当前专利权人地址: TWX Hsin-Chu
- 主分类号: G03F9/00
- IPC分类号: G03F9/00 ; H01L21/762 ; H01L23/544 ; H01L21/76 ; H01L21/46
摘要:
The outer box of a box-in-box alignment pattern can be difficult to see if implemented in damascene technology. The present invention solves this problem by forming its outline from a trench that is substantially deeper than the channel used to contain the damascene wiring. This trench is formed at the same time that first vias are etched so no extra processing steps are needed, only one extra mask. The metal used for the damascene wiring also lines the inside of the trench, resulting in a structure that is easily seen during the alignment step. These outer box trenches may be simple squares or they may be ring shaped (hollow squares). Three different embodiments of the invention are described.
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