发明授权
- 专利标题: Projection exposure apparatus and projection exposure method
- 专利标题(中): 投影曝光装置和投影曝光方法
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申请号: US315841申请日: 1994-09-30
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公开(公告)号: US6094268A公开(公告)日: 2000-07-25
- 发明人: Yoshitada Oshida , Tetsuzo Tanimoto , Minoru Tanaka
- 申请人: Yoshitada Oshida , Tetsuzo Tanimoto , Minoru Tanaka
- 申请人地址: JPX Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX1-100025 19890421; JPX1-100026 19890421; JPX1-249123 19890927; JPX1-257033 19891003; JPX2-45387 19900228; JPX2-64155 19900316
- 主分类号: G03F7/207
- IPC分类号: G03F7/207 ; G03F9/00 ; G01B11/14
摘要:
A projection exposure apparatus (1) comprises an incident light optical system for causing the light emitted from a light source 1 to enter an object of exposure (4) in diagonal direction, a detection apparatus (3) for causing an interference between the light reflected from the object of exposure (4) and a reference light and detecting the resultant interference fringe, a processing circuit for determining the inclination and height of the surface of the object of exposure (4) from the optical information on the interference fringe, and a stage (7) for supporting the object of exposure (4). The object of exposure (4) is subjected to projection exposure by driving the stage (7) according to the calculated inclination and height of the object of exposure (4).
公开/授权文献
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