Invention Grant
- Patent Title: Method of fabricating self-aligned contact
- Patent Title (中): 自对准接触的方法
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Application No.: US27844Application Date: 1998-02-23
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Publication No.: US6107175APublication Date: 2000-08-22
- Inventor: Han Lin , Sun-Chieh Chien , Jengping Lin
- Applicant: Han Lin , Sun-Chieh Chien , Jengping Lin
- Applicant Address: TWX Hsin-Chu
- Assignee: United Microelectronics Corp.
- Current Assignee: United Microelectronics Corp.
- Current Assignee Address: TWX Hsin-Chu
- Priority: TWX87100404 19980114
- Main IPC: H01L21/285
- IPC: H01L21/285 ; H01L21/60 ; H01L21/3205
Abstract:
A method of a method of fabricating a contact. A substrate having a plurality of gates and a plurality of lightly doped source/drain regions is provided. A dielectric layer is formed and patterned to form a self-align contact window to expose a first lightly doped source/drain region of said lightly doped source/drain regions, and to form a first spacer on a side wall of a first gate of said gates simultaneously. An ion implantation is performed by using the first spacer as a mask, so that a first heavily doped source/drain region is formed in the first lightly doped source/drain region. A doped poly-silicon layer is formed over the substrate, and a metal silicide layer is formed on the doped poly-silicon layer. The doped poly-silicon and the metal silicide layer are patterned to form a self-align contact.
Public/Granted literature
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