发明授权
- 专利标题: Method for forming titanium silicide in situ
- 专利标题(中): 原位形成硅化钛的方法
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申请号: US13823申请日: 1998-01-27
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公开(公告)号: US6110821A公开(公告)日: 2000-08-29
- 发明人: Gene Y. Kohara , Fusen Chen , Hyman Joseph Levinstein , Zheng Xu , Peijun Ding , Gongda Yao , Hong Zhang
- 申请人: Gene Y. Kohara , Fusen Chen , Hyman Joseph Levinstein , Zheng Xu , Peijun Ding , Gongda Yao , Hong Zhang
- 申请人地址: CA Santa Clara
- 专利权人: Applied Materials, Inc.
- 当前专利权人: Applied Materials, Inc.
- 当前专利权人地址: CA Santa Clara
- 主分类号: C23C14/18
- IPC分类号: C23C14/18 ; C23C14/54 ; H01L21/285 ; H01L21/768 ; H01L21/4763 ; H01L21/44
摘要:
Titanium is sputtered in an ionized metal plasma sputtering chamber to form titanium silicide in situ in the bottom of openings onto silicon in a series of steps that change the temperature and deposition conditions of sputtering. Ionized titanium is sputtered cold, the temperature is rapidly increased by passing argon through the heated substrate support without sputtering, thereby initiating titanium silicide formation, and then the sputtering of titanium ions is continued at high temperatures to deposit titanium silicide.To deposit titanium silicide in very high aspect ratio openings, a first layer of titanium atoms is sputter deposited in conventional manner to line the sidewalls of the openings, followed by sputtering from a plasma and continuing with the above process.
公开/授权文献
- USD359241S Round analog clock 公开/授权日:1995-06-13
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