发明授权
- 专利标题: Translucency measurement
- 专利标题(中): 半透明度测量
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申请号: US37163申请日: 1998-03-10
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公开(公告)号: US06111653A公开(公告)日: 2000-08-29
- 发明人: Stephen Paul Bucknell , Nigel John Peter Winsey , Desmond Roy Gale
- 申请人: Stephen Paul Bucknell , Nigel John Peter Winsey , Desmond Roy Gale
- 申请人地址: GBX
- 专利权人: Dia-Stron Limited
- 当前专利权人: Dia-Stron Limited
- 当前专利权人地址: GBX
- 主分类号: A61B5/103
- IPC分类号: A61B5/103 ; G01N21/47 ; G01B9/02
摘要:
The translucency of a material is determined by illuminating the material and detecting the intensity of radiation leaving the material as a function of distance from the radiation source. The resulting measurements may be used to determine a "translucency gradient" for the material. In the case of materials in sheet form or having a defined thickness, the translucency can be measured in transmission mode or back scattering mode to measure "through translucency" or "surface translucency".
公开/授权文献
- USD366618S Bottle 公开/授权日:1996-01-30
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