发明授权
- 专利标题: Electron probe microanalyzer
- 专利标题(中): 电子探针微量分析仪
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申请号: US12022申请日: 1998-01-22
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公开(公告)号: US6118123A公开(公告)日: 2000-09-12
- 发明人: Satoshi Notoya
- 申请人: Satoshi Notoya
- 申请人地址: JPX Tokyo
- 专利权人: JEOL Ltd.
- 当前专利权人: JEOL Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX9-022875 19970205
- 主分类号: G01Q20/04
- IPC分类号: G01Q20/04 ; G01Q30/02 ; G01Q30/20 ; H01J37/21 ; H01J37/256
摘要:
There is disclosed an electron probe microanalyzer capable of achieving focusing after movement of a specimen in a shorter time than conventional, thus improving the total measuring efficiency. When movement into a specified analysis point on the specimen is completed, an automatic focusing device automatically performs a focusing operation consisting of scanning a relatively narrow range. If this operation is performed unsuccessfully, the automatic focusing device automatically performs a second focusing operation consisting of scanning a wider range. Thus, the instrument searches for a focal point.
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