发明授权
- 专利标题: Method of enhancing semiconductor wafer release
- 专利标题(中): 增强半导体晶片释放的方法
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申请号: US161793申请日: 1998-09-28
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公开(公告)号: US6132294A公开(公告)日: 2000-10-17
- 发明人: Chenting Lin
- 申请人: Chenting Lin
- 申请人地址: DEX Munich
- 专利权人: Siemens Aktiengesellschaft
- 当前专利权人: Siemens Aktiengesellschaft
- 当前专利权人地址: DEX Munich
- 主分类号: B24B37/04
- IPC分类号: B24B37/04 ; H01L21/304 ; H01L21/306 ; B24B1/00
摘要:
In accordance with the present invention, a method is disclosed for releasing semiconductor wafers from a polishing pad. The method includes the steps of applying a slurry to a polishing pad, rotating the polishing pad having slurry thereon while applying pressure against a wafer such that the wafer is polished by the slurry, introducing water to the polishing pad, increasing the rotational speed of the polishing pad to remove a portion of the slurry, decreasing the pressure during the step of increasing rotational speed to substantially prevent further polishing and removing the wafer from the polishing pad.
公开/授权文献
- US5479871A Emergency power system for submarines 公开/授权日:1996-01-02
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