发明授权
- 专利标题: Method for thermally calibrating circuit breaker trip mechanism and associated trip mechanism
- 专利标题(中): 热校准断路器跳闸机构和相关跳闸机构的方法
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申请号: US498216申请日: 2000-02-04
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公开(公告)号: US6135633A公开(公告)日: 2000-10-24
- 发明人: Bernard DiMarco , Robert G. Bergman , David A. Leone , Christoph Hamann
- 申请人: Bernard DiMarco , Robert G. Bergman , David A. Leone , Christoph Hamann
- 申请人地址: GA Alpharetta
- 专利权人: Siemens Energy & Automation, Inc.
- 当前专利权人: Siemens Energy & Automation, Inc.
- 当前专利权人地址: GA Alpharetta
- 主分类号: H01H69/01
- IPC分类号: H01H69/01 ; H01H71/74 ; H01H37/12 ; B23K9/00 ; G01K15/00 ; G01N25/34
摘要:
A method for adjusting the calibration of a circuit breaker trip mechanism including a terminal element, a bimetal element connected thereto, and a trip bar. Laser energy is applied to lanced or pre-bent surfaces of the terminal element to thermally induce displacement thereof and thereby modify a trip distance between the bimetal element and the trip bar. Where a laser beam is directed to fall on a middle leg of a lanced or pre-bent section of the terminal element, the bimetal element moves in one direction relative to the trip bar. Conversely, where a laser beam is directed to fall on lateral legs of the lanced or pre-bent section of the terminal element, the bimetal element moves in an opposite direction relative to the trip bar. Thus, laser energy may be applied from the same direction, or to the same side of the trip structure, regardless of whether the trip time is to be increased or decreased.
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