Invention Grant
- Patent Title: Antireflection treatment of reflective surfaces
- Patent Title (中): 反射表面的防反射处理
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Application No.: US08996684Application Date: 1997-12-23
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Publication No.: US06177235B1Publication Date: 2001-01-23
- Inventor: Jean Marc Francou , Aomar Halimaoui , Andr{acute over (e)} Schiltz
- Applicant: Jean Marc Francou , Aomar Halimaoui , Andr{acute over (e)} Schiltz
- Priority: FR9616106 19961227
- Main IPC: G03F726
- IPC: G03F726

Abstract:
The present invention relates to an improved photolithography process particularly suitable for high-resolution optical lithography techniques using the g, h and i lines of the spectrum of mercury and short-wavelength UV, comprising, prior to deposition of the photosensitive resin on the layer of material to be lithographically patterned, the formation of an antireflective porous layer within the said layer to be lithographically patterned and on the surface of the latter.
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