发明授权
US06178116B1 Memory cell of non-volatile semiconductor memory device 失效
非易失性半导体存储器件的存储单元

  • 专利标题: Memory cell of non-volatile semiconductor memory device
  • 专利标题(中): 非易失性半导体存储器件的存储单元
  • 申请号: US09550791
    申请日: 2000-04-17
  • 公开(公告)号: US06178116B1
    公开(公告)日: 2001-01-23
  • 发明人: Hiroshi Iwahashi
  • 申请人: Hiroshi Iwahashi
  • 优先权: JP62-161625 19870629; JP62-163023 19870630; JP62-325686 19871223
  • 主分类号: G11C1604
  • IPC分类号: G11C1604
Memory cell of non-volatile semiconductor memory device
摘要:
The current paths of a plurality of floating gate type MOSFETs are series-connected to form a series circuit. The series circuit is connected at one end to receive a reference voltage, and is connected to data programming and readout circuit. In the data programming mode, electrons are discharged from the floating gate to the drain of the MOSFET or holes are injected into the drain into the floating gate. The data readout operation is effected by checking whether current flows from the other end to the one end of the series circuit or not.
信息查询
0/0