发明授权
- 专利标题: Method of producing a memory cell configuration
- 专利标题(中): 产生存储单元配置的方法
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申请号: US09095260申请日: 1998-06-10
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公开(公告)号: US06180458B2公开(公告)日: 2001-01-30
- 发明人: Wolfgang Krautschneider , Franz Hofmann , Wolfgang Roesner
- 申请人: Wolfgang Krautschneider , Franz Hofmann , Wolfgang Roesner
- 优先权: DE19603810 19960202
- 主分类号: H01L21336
- IPC分类号: H01L21336
摘要:
A memory cell configuration includes first memory cells with planar MOS transistors and second memory cells with vertical MOS transistors. The planar MOS transistors are disposed on the bottom of and on the crown of parallel, strip-like trenches. The vertical MOS transistors are disposed on the side walls of the trenches. The memory cell configuration can be produced with a mean area requirement for each memory cell of 1 F2, where F is the minimum structure size.
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