发明授权
- 专利标题： Particle analyzer system
- 专利标题（中）： 粒子分析仪系统
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申请号： US09061848申请日： 1998-04-18
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公开(公告)号： US06184517B2公开(公告)日： 2001-02-06
- 发明人: Tsuguo Sawada , Takehiko Kitamori , Toshitsugu Ueda , Seiichi Naitou , Hisao Takahara , Yukihiko Takamatsu
- 申请人： Tsuguo Sawada , Takehiko Kitamori , Toshitsugu Ueda , Seiichi Naitou , Hisao Takahara , Yukihiko Takamatsu
- 优先权： JP9-103770 19970422
- 主分类号： G01V800
- IPC分类号： G01V800
摘要：
A particle analyzer system that reduces size and cost, wherein particles are introduced into a cell, then the particles are irradiate in the cell with a laser beam, then atomic emission of the particles generated by the irradiation of the laser beam is transmitted, then a spectrum is obtained of the photo emission so transmitted, and the spectrum of the photo emission is detected and the wavelength of the laser beam is, other than the wavelength of the emission of the particles, is used to provide a filter to block the intrusion of the wavelength of the laser beam in a stage proceeding the photo emission.