发明授权
US06200022B1 Method and apparatus for localized dynamic mechano-thermal analysis with scanning probe microscopy
有权
用扫描探针显微镜进行局部动态力学热分析的方法和装置
- 专利标题: Method and apparatus for localized dynamic mechano-thermal analysis with scanning probe microscopy
- 专利标题(中): 用扫描探针显微镜进行局部动态力学热分析的方法和装置
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申请号: US09224600申请日: 1998-12-31
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公开(公告)号: US06200022B1公开(公告)日: 2001-03-13
- 发明人: Azzedine Hammiche , Hubert Murray Montague-Pollock , Michael Reading
- 申请人: Azzedine Hammiche , Hubert Murray Montague-Pollock , Michael Reading
- 主分类号: G01N2520
- IPC分类号: G01N2520
摘要:
A system and method for performing localized mechanothermal analysis with scanning probe microscopy (“MASM”) is disclosed. In a preferred embodiment an image of the surface or subsurface of a sample is created. A localized region of the sample is selected from the image. Using a scanning microscope, an active or passive thermal probe is positioned at the selected region. A temperature ramp is applied to the localized region. In addition, a dynamic or modulated stress or strain is applied to the localized region. Force data resulting from the applied temperature and stress or strain is collected and processed to produce a graph or fingerprint of the dynamic mechanical and/or calorimetric properties of the selected localized region.
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