发明授权
- 专利标题: Two-dimensional spectral characteristic measuring apparatus
- 专利标题(中): 二维光谱特征测量装置
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申请号: US09226160申请日: 1999-01-07
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公开(公告)号: US06222631B1公开(公告)日: 2001-04-24
- 发明人: Koichi Terauchi
- 申请人: Koichi Terauchi
- 优先权: JP10-002371 19980108
- 主分类号: G01J351
- IPC分类号: G01J351
摘要:
This spectral characteristic measuring apparatus measures two-dimensional spectral characteristics of a sample, and the apparatus includes a collimator lens, band-pass filters, lenses and an area sensor, which are arranged in order on an optical axis L. The collimator lens transforms light outputted from the sample into a pencil of parallel light. The band-pass filters have mutually-different passbands. The lenses have an identical focal distance and are arranged in correspondence with the band-pass filters. The area sensor is arranged at the focal points of the lenses and constructed of a number of imaging devices such as CCDs arranged two-dimensionally. As described above, the images spectrally separated by the band-pass filters are formed in mutually-different positions on the area sensor. Therefore, the two-dimensional spectral characteristics of the sample can be simultaneously measured with the simple construction.
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