发明授权
US06222631B1 Two-dimensional spectral characteristic measuring apparatus 有权
二维光谱特征测量装置

  • 专利标题: Two-dimensional spectral characteristic measuring apparatus
  • 专利标题(中): 二维光谱特征测量装置
  • 申请号: US09226160
    申请日: 1999-01-07
  • 公开(公告)号: US06222631B1
    公开(公告)日: 2001-04-24
  • 发明人: Koichi Terauchi
  • 申请人: Koichi Terauchi
  • 优先权: JP10-002371 19980108
  • 主分类号: G01J351
  • IPC分类号: G01J351
Two-dimensional spectral characteristic measuring apparatus
摘要:
This spectral characteristic measuring apparatus measures two-dimensional spectral characteristics of a sample, and the apparatus includes a collimator lens, band-pass filters, lenses and an area sensor, which are arranged in order on an optical axis L. The collimator lens transforms light outputted from the sample into a pencil of parallel light. The band-pass filters have mutually-different passbands. The lenses have an identical focal distance and are arranged in correspondence with the band-pass filters. The area sensor is arranged at the focal points of the lenses and constructed of a number of imaging devices such as CCDs arranged two-dimensionally. As described above, the images spectrally separated by the band-pass filters are formed in mutually-different positions on the area sensor. Therefore, the two-dimensional spectral characteristics of the sample can be simultaneously measured with the simple construction.
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