发明授权
- 专利标题: Method for detecting defect of transparent body, method for producing transparent body
- 专利标题(中): 透明体缺陷检测方法,透明体制造方法
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申请号: US09274936申请日: 1999-03-23
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公开(公告)号: US06226080B1公开(公告)日: 2001-05-01
- 发明人: Yukihisa Takeuchi , Tsutomu Nanataki , Iwao Ohwada , Kei Sato
- 申请人: Yukihisa Takeuchi , Tsutomu Nanataki , Iwao Ohwada , Kei Sato
- 优先权: JP10-075962 19980324; JP11-050914 19990226
- 主分类号: G01N2117
- IPC分类号: G01N2117
摘要:
Defect of an acrylic plate is detected such that a light beam, which dominantly includes non-parallel rays not parallel to a principal surface of the acrylic plate, is introduced through a side surface formed substantially perpendicularly to the principal surface of the acrylic plate. In this arrangement, transmitted light, which is obtained through the principal surface of the acrylic plate on the basis of the defect, is detected by using any one of or both of a light-receiving device with its light-receiving surface arranged and directed substantially in parallel to the principal surface of the acrylic plate and a light-receiving device with its light-receiving surface arranged and directed substantially perpendicularly to the principal surface of the acrylic plate. Thus, the defect of the acrylic plate is quantitatively detected by measuring the amount of light of the transmitted light. Accordingly, an identical optical system can be used to perform the detection of, for example, the surface scratch of the acrylic plate as well as the bubble and the foreign matter in the acrylic plate simultaneously with the detection of the defect such as the bend and the waviness of the acrylic plate itself.
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