发明授权
- 专利标题： Mechanical fixture for holding electronic devices under test showing adjustments in multiple degrees of freedom
- 专利标题（中）： 用于保持被测电子设备的机械夹具显示多个自由度的调整
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申请号： US09418655申请日： 1999-10-15
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公开(公告)号： US06262582B1公开(公告)日： 2001-07-17
- 发明人: Dennis R. Barringer , Mark R. LaForce , Mark A. Marnell , Donald W. Porter , Roger R. Schmidt , Wade H. White
- 申请人： Dennis R. Barringer , Mark R. LaForce , Mark A. Marnell , Donald W. Porter , Roger R. Schmidt , Wade H. White
- 主分类号： G01R3102
- IPC分类号： G01R3102
摘要：
A fixture to hold an electronic substrate having probe areas on a top surface. The top surface of the electronic substrate is left open to provide a maximum area to couple interconnect wires for a device under test. In addition, a bottom surface of the substrate is left open to provide a maximum area to couple with a probe card in one embodiment, or a test head in another embodiment. This open bottom and open top minimize the mechanical interference with electrical connections. The substrate is planarized to a frame by one or more clamps that are attached to the frame. The clamps provide adjustment of the pressure down on the substrate in a Z-axis direction which is normal to the top surface of the substrate for providing a good connection with a planar card. In addition, the clamps provide adjustment in the an X-Y plane parallel to the frame and rotational correction about the Z-axis.
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