发明授权
US06265283B1 Self-aligning silicon oxynitride stack for improved isolation structure
有权
自对准硅氮氧化物叠层,用于改善隔离结构
- 专利标题: Self-aligning silicon oxynitride stack for improved isolation structure
- 专利标题(中): 自对准硅氮氧化物叠层,用于改善隔离结构
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申请号: US09373217申请日: 1999-08-12
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公开(公告)号: US06265283B1公开(公告)日: 2001-07-24
- 发明人: Homi E. Nariman , Sey-Ping Sun , H. Jim Fulford
- 申请人: Homi E. Nariman , Sey-Ping Sun , H. Jim Fulford
- 主分类号: H01L2176
- IPC分类号: H01L2176
摘要:
Methods of fabricating an isolation structure on a substrate are provided. In one aspect, a method of fabricating an isolation structure on a substrate is provided that includes forming a first insulating layer on the substrate wherein the first insulating layer has a first sidewall. A trench is formed in the substrate that has a second sidewall. A second insulating layer is formed in the trench. The second insulating layer displaces the second sidewall laterally. The first insulating layer is densified by heating to liberate gas therefrom and thereby move the first sidewall into substantial vertical alignment with the second sidewall. The risk of substrate attack due to trench isolation structure pullback is reduced. Trench edges are covered by thick isolation material.
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