发明授权
- 专利标题: Electrostatic-discharge protection circuit
- 专利标题(中): 静电放电保护电路
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申请号: US09248547申请日: 1999-02-11
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公开(公告)号: US06268639B1公开(公告)日: 2001-07-31
- 发明人: Sheau-Suey Li , Shahin Toutounchi , Michael J. Hart , Xin X. Wu , Daniel Gitlin
- 申请人: Sheau-Suey Li , Shahin Toutounchi , Michael J. Hart , Xin X. Wu , Daniel Gitlin
- 主分类号: H01L218222
- IPC分类号: H01L218222
摘要:
An ESD protection circuit includes a bipolar transistor, a resistor, and a zener diode formed on and within a semiconductor substrate. The resistor extends between the base and emitter regions of the transistor so that voltage developed across the resistor can turn on the transistor. The zener diode is formed in series with the resistor and extends between the base and collector regions of the transistor. Thus configured, breakdown current through the zener diode, typically in response to an ESD event, turns on the transistor to provide a nondestructive discharge path for the ESD. The zener diode includes anode and cathode diffusions. The cathode diffusion extends down into the semiconductor substrate in a direction perpendicular to the substrate. The anode diffusion extends down through the cathode diffusion into the semiconductor substrate. The anode diffusion extends down further than the cathode diffusion so that the zener diode is arranged vertically with respect to the substrate. The cathode diffusion can be formed using two separate diffusions, one of which extends deeper into the substrate than other.
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