发明授权
- 专利标题: Integrated process for copper via filling
- 专利标题(中): 铜通过灌装的综合工艺
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申请号: US09677946申请日: 2000-10-02
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公开(公告)号: US06274008B1公开(公告)日: 2001-08-14
- 发明人: Praburam Gopalraja , Jianming Fu , Fusen Chen , Girish Dixit , Zheng Xu , Sankaram Athreya , Wei D. Wang , Ashok K. Sinha
- 申请人: Praburam Gopalraja , Jianming Fu , Fusen Chen , Girish Dixit , Zheng Xu , Sankaram Athreya , Wei D. Wang , Ashok K. Sinha
- 主分类号: C23C1434
- IPC分类号: C23C1434
摘要:
A target and magnetron for a plasma sputter reactor. The target has an annular vault facing the wafer to be sputter coated. Various types of magnetic means positioned around the vault create a magnetic field supporting a plasma extending over a large volume of the vault. An integrated copper via filling process includes a first step of highly ionized sputter deposition of copper, a second step of more neutral, lower-energy sputter deposition of copper to complete the seed layer, and electroplating copper into the hole to complete the metallization.
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