发明授权
US06284583B1 Semiconductor device and method of manufacturing the same 失效
半导体装置及其制造方法

  • 专利标题: Semiconductor device and method of manufacturing the same
  • 专利标题(中): 半导体装置及其制造方法
  • 申请号: US09105024
    申请日: 1998-06-26
  • 公开(公告)号: US06284583B1
    公开(公告)日: 2001-09-04
  • 发明人: Shigehiko SaidaYoshitaka Tsunashima
  • 申请人: Shigehiko SaidaYoshitaka Tsunashima
  • 优先权: JP9-174681 19970630; JP10-167092 19980615
  • 主分类号: H01L218249
  • IPC分类号: H01L218249
Semiconductor device and method of manufacturing the same
摘要:
A semiconductor device comprises a semiconductor substrate and a silicon nitride film formed on the semiconductor substrate. The silicon nitride film is substantially free from an Si—H bond and has an Si—H density per unit area of 1×1015 cm−2 or less.
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