发明授权
US06284641B1 Method of forming a contact using a sacrificial spacer 有权
使用牺牲间隔物形成接触的方法

  • 专利标题: Method of forming a contact using a sacrificial spacer
  • 专利标题(中): 使用牺牲间隔物形成接触的方法
  • 申请号: US09174300
    申请日: 1998-10-16
  • 公开(公告)号: US06284641B1
    公开(公告)日: 2001-09-04
  • 发明人: Kunal R. Parekh
  • 申请人: Kunal R. Parekh
  • 主分类号: H01L214763
  • IPC分类号: H01L214763
Method of forming a contact using a sacrificial spacer
摘要:
Disclosed is a method of forming a self-aligned contact to a semiconductor substrate by use of a sacrificial spacer. The sacrificial spacer has the advantage of self aligning metallization to the semiconductive substrate or to a polysilicon plug material without extra photolithography steps as are required in the prior art.
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