发明授权
- 专利标题: Method of forming a contact using a sacrificial spacer
- 专利标题(中): 使用牺牲间隔物形成接触的方法
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申请号: US09174300申请日: 1998-10-16
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公开(公告)号: US06284641B1公开(公告)日: 2001-09-04
- 发明人: Kunal R. Parekh
- 申请人: Kunal R. Parekh
- 主分类号: H01L214763
- IPC分类号: H01L214763
摘要:
Disclosed is a method of forming a self-aligned contact to a semiconductor substrate by use of a sacrificial spacer. The sacrificial spacer has the advantage of self aligning metallization to the semiconductive substrate or to a polysilicon plug material without extra photolithography steps as are required in the prior art.
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