发明授权
US06288965B1 Reference voltage generating circuit, semiconductor memory device and burn-in method therefor 失效
参考电压发生电路,半导体存储器件及其老化方法

  • 专利标题: Reference voltage generating circuit, semiconductor memory device and burn-in method therefor
  • 专利标题(中): 参考电压发生电路,半导体存储器件及其老化方法
  • 申请号: US09592787
    申请日: 2000-06-13
  • 公开(公告)号: US06288965B1
    公开(公告)日: 2001-09-11
  • 发明人: Motoko HaraSeiji Sawada
  • 申请人: Motoko HaraSeiji Sawada
  • 优先权: JP12-000079 20000104
  • 主分类号: G11C700
  • IPC分类号: G11C700
Reference voltage generating circuit, semiconductor memory device and burn-in method therefor
摘要:
A reference voltage generating circuit having a fuse for controlling resistance includes a burn-in circuit for supplying burn-in voltage between opposite terminals of the fuse when a control signal is inputted to the burn-in circuit.
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