发明授权
- 专利标题： X-ray examination apparatus
- 专利标题（中）： X光检查仪
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申请号： US09208505申请日： 1998-12-09
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公开(公告)号： US06292534B1公开(公告)日： 2001-09-18
- 发明人: Petrus W. J. Linders , Hendrik J. Meulenbrugge
- 申请人： Petrus W. J. Linders , Hendrik J. Meulenbrugge
- 优先权： EP97203873 19971210
- 主分类号： G01T100
- IPC分类号： G01T100
摘要：
An X-ray examination apparatus includes an X-ray detector for deriving an image signal from an X-ray image. The X-ray detector has an essentially elongate X-ray-sensitive surface. The X-ray sensitive surface of the X-ray detector corresponds notably to a relevant part of the object to be examined.
信息查询
