发明授权
- 专利标题： Apparatus and method for detecting samples labeled with material having strong light scattering properties, using reflection mode light and diffuse scattering
- 专利标题（中）： 使用反射模式光和漫射散射光检测用具有强光散射特性的材料标记的样品的装置和方法
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申请号： US09013596申请日： 1998-01-26
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公开(公告)号： US06294327B1公开(公告)日： 2001-09-25
- 发明人: Ian D. Walton , Mark O. Trulson , Richard P. Rava
- 申请人： Ian D. Walton , Mark O. Trulson , Richard P. Rava
- 主分类号： C12Q168
- IPC分类号： C12Q168
摘要：
A system and method for imaging a sample labeled with a material having a strong light scattering and reflecting properties are provided. A typical material having strong light scattering and reflecting properties is a metal colloid. The imaging system employs a light scattering and reflecting illumination technique. The sample can be imaged with reflection mode imaging along or with a combination of reflection mode and scatter mode imaging.
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