发明授权
- 专利标题： Control apparatus for testing a random access memory
- 专利标题（中）： 用于测试随机存取存储器的控制装置
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申请号： US09649125申请日： 2000-08-28
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公开(公告)号： US06295239B1公开(公告)日： 2001-09-25
- 发明人: Vinod Nair Gopikuttan Nair
- 申请人： Vinod Nair Gopikuttan Nair
- 主分类号： G11C700
- IPC分类号： G11C700
摘要：
A logic device includes a RAM and control apparatus (10). The control apparatus (10) is adapted to receive input signals (6) from a processor and the control apparatus (10) is also adapted to be coupled to the RAM to send signals to the RAM in response to the input signals (6). The control apparatus (10) includes a data generator (3) and the data generator generates a test bit pattern which is dependent on the received input signals (6).
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