Invention Grant
US06297997B1 Semiconductor device capable of reducing cost of analysis for finding replacement address in memory array
失效
能够降低分析成本的半导体器件，用于在存储器阵列中寻找替换地址
- Patent Title: Semiconductor device capable of reducing cost of analysis for finding replacement address in memory array
- Patent Title (中): 能够降低分析成本的半导体器件，用于在存储器阵列中寻找替换地址
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Application No.: US09459538Application Date: 1999-12-13
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Publication No.: US06297997B1Publication Date: 2001-10-02
- Inventor: Jun Ohtani , Mitsuhiro Hamada
- Applicant: Jun Ohtani , Mitsuhiro Hamada
- Priority: JP11-186168 19990630
- Main IPC: G11C700
- IPC: G11C700
Abstract:
In a semiconductor device including banks A and B, testing and redundancy analysis of the bank B are first carried out by using a conventional tester, and redundancy replacement is carried out. Then, the bank A is tested by a BIST circuit and the test result of each bit is written to the bank B. By using the bank B as a memory for defect analysis, a tester connected to the semiconductor device while testing the bank A does not need a large capacity analysis memory. Thus, an inexpensive redundancy analysis system can be provided.
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