An integrated circuit fabrication process is provided for forming, a mutual implant region within a well which is shared by a source region of a transistor residing within the well and a well-tie region coupled to the well, thereby providing a single electrical link to the well and the source region. Contacts may be coupled to the mutual implant region, and a conductor may be connected to the contacts. In the instance that the well is a p-type well in which NMOS transistors are formed, a ground voltage may be applied to the conductor to bias both the source region and the well. On the other hand, if the well is an n-type well in which PMOS transistors are formed, a power voltage, VCC, may be applied to the conductor to bias both the source region and the well. Absent the need to form contacts to both the source region and the well-tie region and conductors to such contacts, less space is required to bias the well and the source region. Also, merging a portion of the well-tie region with a portion of the source region affords increased packing density of an integrated circuit. The higher packing density is achieved without resorting to decreasing the dimensions of the well-tie region, and thus without detrimentally increasing the resistance of the well-tie region.