发明授权
- 专利标题: CMOS device structures and method of making same
- 专利标题(中): CMOS器件结构及其制作方法
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申请号: US09717971申请日: 2000-11-21
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公开(公告)号: US06303450B1公开(公告)日: 2001-10-16
- 发明人: Heemyong Park , Anda C. Mocuta , Werner Rausch
- 申请人: Heemyong Park , Anda C. Mocuta , Werner Rausch
- 主分类号: H01L21336
- IPC分类号: H01L21336
摘要:
Disclosed is a method comprising providing a silicon surface with an underlying insulator layer, providing a plurality of gates adjacent to source/drain regions, growing source/drains between the said gates such that the source/drains are thicker in regions of larger gate-to-gate pitch, and doping the source/drains with one or more dopants such that the dopants abut the underlying insulator layer.
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