A plurality of systems and methods for generating reproducible illumination by adjusting solid-state devices regulated by a control system that illuminate sample parts in a compensated, standardized manner. An illumination system includes an illumination source directed onto the optical axis of a light collection system. The light collection system includes a collection lens assembly and at least one CCD detector. The lens assembly and CCD detector perform the spatial imaging of the sample part. An optical element positioned between the illumination source and the sample part redirects a portion of the entire energy emitted from the illumination source to a monitoring detector. The monitoring detector measures the optical power illuminating the sample part and compares it to a previously measured reference illumination source level. Based on the results of the comparison and additional input from temperature, color and other sensor, the drive current to the illuminating source is adjusted to consistently illuminate the sample part within an instrument model line and over an extended time period.