发明授权
US06310579B1 Method and apparatus for calibrating antenna apparatus and testing an antenna connected thereto 有权
用于校准天线装置并测试与其连接的天线的方法和装置

  • 专利标题: Method and apparatus for calibrating antenna apparatus and testing an antenna connected thereto
  • 专利标题(中): 用于校准天线装置并测试与其连接的天线的方法和装置
  • 申请号: US09570101
    申请日: 2000-05-12
  • 公开(公告)号: US06310579B1
    公开(公告)日: 2001-10-30
  • 发明人: Sheldon K. Meredith
  • 申请人: Sheldon K. Meredith
  • 主分类号: G01R124
  • IPC分类号: G01R124
Method and apparatus for calibrating antenna apparatus and testing an antenna connected thereto
摘要:
A method and apparatus for calibrating an antenna apparatus and testing an antenna connected thereto is provided. The calibration is conducted without an antenna connected to establish a baseline return loss calibration coefficient. Thereafter, after an antenna is connected, a test may be conducted to measure the performance of the antenna on the antenna site apparatus. The calibration process includes measuring a leakage signal, measuring an average of the magnitude of a ripple output of the reflection signal over a frequency range to determine the baseline return loss calibration. Thereafter, if the antenna is connected and the test signal is again swept over frequency, then a new ripple factor is determined for the antenna and a new mean output voltage for Vant is determined. By comparing the new average output voltage for Vant and the baseline return loss calibration, one can determine information about the performance of the antenna.
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