发明授权
- 专利标题: Micro-geometry measuring device
- 专利标题(中): 微观几何测量装置
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申请号: US09461655申请日: 1999-12-14
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公开(公告)号: US06314800B1公开(公告)日: 2001-11-13
- 发明人: Kunitoshi Nishimura
- 申请人: Kunitoshi Nishimura
- 优先权: JP10-356187 19981215
- 主分类号: G01B528
- IPC分类号: G01B528
摘要:
A micro-geometry measuring device capable of reducing measuring force thereof for avoiding damage on micro-geometry of workpiece surface and measuring at a high-speed is provided. The micro-geometry measuring device has a stylus mechanism having a stylus mechanism provided to an arm and having a stylus body, a measuring force adjusting mechanism for adjusting a measuring force working between the stylus body and the workpiece, a displacement sensor for detecting a position of the arm, and a measuring force controller for controlling the measuring force adjusting mechanism. The stylus mechanism includes a vibrator for resonantly vibrating the stylus body, and a detector for detecting vibration status changing when the stylus body touches the workpiece. The change in vibration of the stylus body vibrated by the vibrator is directly detected by the detector and a signal therefrom is fed back to the measuring force controller to keep constant measuring force working between the stylus body and the workpiece.
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