发明授权
US06335884B1 Semiconductor memory device and defect remedying method thereof 有权
半导体存储器件及其缺陷补救方法

Semiconductor memory device and defect remedying method thereof
摘要:
Herein disclosed is a semiconductor memory device, in which peripheral circuits are arranged in a cross area of a semiconductor chip composed of the longitudinal center portions and the transverse center portions, and in which memory arrays are arranged in the four regions which are divided by the cross area. Thanks to this structure in which the peripheral circuits are arranged at the center portion of the chip, the longest signal transmission paths can be shortened to about one half of the chip size to speed up the DRAM which is intended to have a large storage capacity.
信息查询
0/0