• 专利标题: Carrier head with a substrate detection mechanism for a chemical mechanical polishing system
  • 申请号: US09595500
    申请日: 2000-06-16
  • 公开(公告)号: US06343973B1
    公开(公告)日: 2002-02-05
  • 发明人: Sasson Somekh
  • 申请人: Sasson Somekh
  • 主分类号: B24B4900
  • IPC分类号: B24B4900
Carrier head with a substrate detection mechanism for a chemical mechanical polishing system
摘要:
A carrier head for a chemical mechanical polishing system includes a substrate sensing mechanism. The carrier head includes a base and a flexible member connected to the base to define a chamber. A lower surface of the flexible member provides a substrate receiving surface. The substrate sensing mechanism includes a sensor to measure a pressure in the chamber and generate an output signal representative thereof, and a processor configured to indicate whether the substrate is attached to the substrate receiving surface in response to the output signal.
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