发明授权
- 专利标题： Integrated circuits including voltage-controllable power supply systems that can be used for low supply voltage margin testing and related methods
- 专利标题（中）： 集成电路包括可用于低电源电压裕度测试和相关方法的电压可控供电系统
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申请号： US09399994申请日： 1999-09-20
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公开(公告)号： US06359459B1公开(公告)日： 2002-03-19
- 发明人: Sei-seung Yoon , Sang-pyo Hong
- 申请人： Sei-seung Yoon , Sang-pyo Hong
- 优先权： KR98-39957 19980925
- 主分类号： G01R3128
- IPC分类号： G01R3128
摘要：
Integrated circuits and methods use a margin test voltage generator that is powered at a first power supply voltage to generate a second power supply voltage that has a magnitude that is less than the magnitude of the first power supply voltage. During a low supply voltage margin test, a first logic circuit is powered at the first power supply voltage while a second logic circuit, which is the subject of the test, is powered at the second power supply voltage. As a result, the first power supply voltage may remain at a sufficient magnitude to reliably power other devices or components that are not undergoing the low supply voltage margin test.