发明授权
US06370072B1 Low voltage single-input DRAM current-sensing amplifier 有权
低电压单输入DRAM电流检测放大器

  • 专利标题: Low voltage single-input DRAM current-sensing amplifier
  • 专利标题(中): 低电压单输入DRAM电流检测放大器
  • 申请号: US09726377
    申请日: 2000-11-30
  • 公开(公告)号: US06370072B1
    公开(公告)日: 2002-04-09
  • 发明人: Robert H. DennardArvind Kumar
  • 申请人: Robert H. DennardArvind Kumar
  • 主分类号: G11C702
  • IPC分类号: G11C702
Low voltage single-input DRAM current-sensing amplifier
摘要:
In a DRAM memory circuit, a current sensing amplifier is provided that exploits the low impedance of a reference transistor biased in the sub-threshold regime to enable transfer of a small voltage swing on the bitline to result in a large voltage signal on a low capacitance sense node. Compared to conventional voltage sensing, reduced bitline-bitline coupling noise results because of the small bitline swing, potentially allowing more cells to be served by a sense amplifier because of weak dependence of sense amplifier on bit-line capacitance. Compared to previous current-sensing schemes, this invention allows no idling current. The current-sensing amplifier additionally may be used in conjunction with a hierarchical bitline scheme to further increase the number of cells served by each sense amplifier.
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