发明授权
US06379748B1 Tantalum amide precursors for deposition of tantalum nitride on a substrate 失效
用于在衬底上沉积氮化钽的钽酰胺前体

  • 专利标题: Tantalum amide precursors for deposition of tantalum nitride on a substrate
  • 专利标题(中): 用于在衬底上沉积氮化钽的钽酰胺前体
  • 申请号: US09483859
    申请日: 2000-01-17
  • 公开(公告)号: US06379748B1
    公开(公告)日: 2002-04-30
  • 发明人: Gautam BhandariThomas H. Baum
  • 申请人: Gautam BhandariThomas H. Baum
  • 主分类号: C23C1406
  • IPC分类号: C23C1406
Tantalum amide precursors for deposition of tantalum nitride on a substrate
摘要:
Tantalum and titanium source reagents are described, including tantalum amide and tantalum silicon nitride precursors for the deposition of tantalum nitride material on a substrate by processes such as chemical vapor deposition, assisted chemical vapor deposition, ion implantation, molecular beam epitaxy and rapid thermal processing. The precursors may be employed to form diffusion barrier layers on microelectronic device structures enabling the use of copper metallization and ferroelectric thin films in device construction.
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