发明授权
US06383574B1 Ion implantation method for fabricating magnetoresistive (MR) sensor element
失效
用于制造磁阻(MR)传感器元件的离子注入方法
- 专利标题: Ion implantation method for fabricating magnetoresistive (MR) sensor element
- 专利标题(中): 用于制造磁阻(MR)传感器元件的离子注入方法
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申请号: US09360118申请日: 1999-07-23
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公开(公告)号: US06383574B1公开(公告)日: 2002-05-07
- 发明人: Cherng-Chyi Han , Rong-Fu Xiao , Mao-Min Chen , Po-Kang Wang
- 申请人: Cherng-Chyi Han , Rong-Fu Xiao , Mao-Min Chen , Po-Kang Wang
- 主分类号: B05D500
- IPC分类号: B05D500
摘要:
A method for forming a magnetoresistive (MR) layer first employs a substrate over which is formed a magnetoresistive (MR) layer formed of a magnetoresistive (MR) material. There is then ion implanted selectively, while employing an ion implant method, the magnetoresistive (MR) layer to form: (1) an ion implanted portion of the magnetoresistive (MR) layer formed of an ion implanted magnetoresistive (MR) material; and (2) an adjoining non ion implanted portion of the magnetoresistive (MR) layer formed of the magnetoresistive (MR) material, where the ion implanted magnetoresistive (MR) material is a non magnetoresistive (MR) material. The method may be employed for forming within magnetoresistive (MR) sensor elements magnetoresistive (MR) layers with enhanced dimensional uniformity, and in particular enhanced overlay dimensional uniformity.
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