发明授权
US06385289B1 X-ray diffraction apparatus and method for measuring X-ray rocking curves
有权
X射线衍射装置和X射线摇摆曲线测量方法
- 专利标题: X-ray diffraction apparatus and method for measuring X-ray rocking curves
- 专利标题(中): X射线衍射装置和X射线摇摆曲线测量方法
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申请号: US09546890申请日: 2000-04-10
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公开(公告)号: US06385289B1公开(公告)日: 2002-05-07
- 发明人: Tetsuo Kikuchi
- 申请人: Tetsuo Kikuchi
- 优先权: JP11-104476 19990412
- 主分类号: G01N1300
- IPC分类号: G01N1300
摘要:
A two-dimensional position-sensitive X-ray detector is used for the precision measurement of lattice constants so that a plurality of X-ray rocking curves can be measured at the same time for the respective points on a sample and an area map, on the sample, of the lattice constants can be obtained in a short time. X-rays from an X-ray source pass through the first slit and are then incident on a crystal collimator. X-rays reflected by the crystal collimator are incident on the sample. X-rays diffracted at the sample are detected by the two-dimensional position-sensitive X-ray detector. The diffracted X-rays from the respective points on the sample are detected separately at respective points on the X-ray detector. X-ray intensities which are detected at respective points on the detecting surface of the X-ray detector are recorded, at the same time, at every rotation angle with a predetermined pitch of angle during sample rotation, so that a plurality of rocking curves for said respective points of the sample can be obtained at the same time.
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