发明授权
US06392753B1 Accelerated damage testing method and apparatus for low loss optical materials 有权
用于低损耗光学材料的加速损坏测试方法和装置

  • 专利标题: Accelerated damage testing method and apparatus for low loss optical materials
  • 专利标题(中): 用于低损耗光学材料的加速损坏测试方法和装置
  • 申请号: US09580342
    申请日: 2000-05-25
  • 公开(公告)号: US06392753B1
    公开(公告)日: 2002-05-21
  • 发明人: Stephan L. Logunov
  • 申请人: Stephan L. Logunov
  • 主分类号: G01B902
  • IPC分类号: G01B902
Accelerated damage testing method and apparatus for low loss optical materials
摘要:
An accelerated radiation damage testing method for an optical sample includes disposing the optical sample inside or external to an optical cavity and injecting a predetermined number of light pulses into the optical cavity at a selected wavelength and at spaced intervals. Each light pulse injected into the optical cavity produces a train of pulses which are focused on the optical sample. The method further includes allowing each light pulse in the optical cavity to decay to a selected value and determining a change in a selected optical property of the optical sample after the optical sample has been exposed to a predetermined number of pulses.
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