发明授权
US06392753B1 Accelerated damage testing method and apparatus for low loss optical materials
有权
用于低损耗光学材料的加速损坏测试方法和装置
- 专利标题: Accelerated damage testing method and apparatus for low loss optical materials
- 专利标题(中): 用于低损耗光学材料的加速损坏测试方法和装置
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申请号: US09580342申请日: 2000-05-25
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公开(公告)号: US06392753B1公开(公告)日: 2002-05-21
- 发明人: Stephan L. Logunov
- 申请人: Stephan L. Logunov
- 主分类号: G01B902
- IPC分类号: G01B902
摘要:
An accelerated radiation damage testing method for an optical sample includes disposing the optical sample inside or external to an optical cavity and injecting a predetermined number of light pulses into the optical cavity at a selected wavelength and at spaced intervals. Each light pulse injected into the optical cavity produces a train of pulses which are focused on the optical sample. The method further includes allowing each light pulse in the optical cavity to decay to a selected value and determining a change in a selected optical property of the optical sample after the optical sample has been exposed to a predetermined number of pulses.
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