Invention Grant
- Patent Title: Measurement method and apparatus
- Patent Title (中): 测量方法和装置
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Application No.: US09339851Application Date: 1999-06-25
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Publication No.: US06403966B1Publication Date: 2002-06-11
- Inventor: Michio Oka
- Applicant: Michio Oka
- Priority: JP10-187774 19980702
- Main IPC: G01J142
- IPC: G01J142

Abstract:
A measurement method and a measurement apparatus for measuring the structure of a micro-structure or the structure along the depth of an object for measurement. The laser light from a solid-state laser light source is subjected to wavelength conversion to generate the ultraviolet laser light, and measurement is made of the object for measurement by heterodyne detection or homodyne detection employing the ultraviolet laser light. This enables measurement of a structure of a micro-structure. Alternatively, the laser light is split into multiple laser light beams and frequency shifted so that the laser light beams will be of different frequencies. The laser light beams are imaged at respective different focal point positions to perform heterodyne detection. The resulting heterodyne signals are separated into respective frequency bands and measurement is made of the structure of the object for measurement in association with the respective imaging points. This enables measurement of the structure of the object for measurement in the direction along its depth.
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