发明授权
US06407545B1 Apparatus and method for measuring remanence curve of a magnetic material
有权
用于测量磁性材料的剩磁曲线的装置和方法
- 专利标题: Apparatus and method for measuring remanence curve of a magnetic material
- 专利标题(中): 用于测量磁性材料的剩磁曲线的装置和方法
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申请号: US09442261申请日: 1999-11-17
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公开(公告)号: US06407545B1公开(公告)日: 2002-06-18
- 发明人: Kenji Sato , Takuya Uzumaki , Tadashi Mizoguchi
- 申请人: Kenji Sato , Takuya Uzumaki , Tadashi Mizoguchi
- 优先权: JP11-080350 19990324
- 主分类号: G01R3312
- IPC分类号: G01R3312
摘要:
An apparatus and a method for measuring the remanence curve of a magnetic material with high accuracy is disclosed. First and second pulse magnetic field coils generate a rapidly-changing pulse magnetic field in the space where a magnetic material is located. First and second air-core coils generate a space of a zero magnetic field as well as a finite magnetic field gradient around the magnetic material after application of a pulse magnetic field. A detector detects the force generated by the cooperation between the magnetic field gradient and the magnetic moment of the magnetic material. An arithmetic unit 33 determines the residual magnetization characteristic of the magnetic material based on the detection result in the detector.
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